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Excess noise behaviour in short n-channel SOI MOSFET's

dc.contributor.authorValenza, M.
dc.contributor.authorBarros, C.
dc.contributor.authorRigaud, D.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-30T09:42:19Z
dc.date.available2021-09-30T09:42:19Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2194
dc.sourceIIOimport
dc.titleExcess noise behaviour in short n-channel SOI MOSFET's
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage265
dc.source.endpage269
dc.source.conferenceNoise in Physical Systems and 1/f Fluctuations: Proceedings of the 14th International Conference
dc.source.conferencedate14/07/1997
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - open access


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