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Innovative schemes to improve reliability and density of horizontal and vertical channel 3D Flash

dc.contributor.authorArreghini, Antonio
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-21T06:42:56Z
dc.date.available2021-10-21T06:42:56Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21985
dc.sourceIIOimport
dc.titleInnovative schemes to improve reliability and density of horizontal and vertical channel 3D Flash
dc.typeProceedings paper
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewyes
dc.source.beginpage151
dc.source.endpage154
dc.source.conference5th International Memory Workshop - IMW
dc.source.conferencedate27/05/2013
dc.source.conferencelocationMonterey, CA USA
imec.availabilityPublished - imec


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