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Automated control of the nanoprober system for nanoscale electrical measurements

dc.contributor.authorArstila, Kai
dc.contributor.authorHantschel, Thomas
dc.contributor.authorNuytten, Thomas
dc.date.accessioned2021-10-21T06:42:59Z
dc.date.available2021-10-21T06:42:59Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21986
dc.sourceIIOimport
dc.titleAutomated control of the nanoprober system for nanoscale electrical measurements
dc.typeOral presentation
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorNuytten, Thomas
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecNuytten, Thomas::0000-0002-5921-6928
dc.source.peerreviewno
dc.source.conferenceKleindiek User Meeting
dc.source.conferencedate16/04/2013
dc.source.conferencelocationKusterdingen Germany
imec.availabilityPublished - imec


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