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dc.contributor.authorBaets, Roel
dc.contributor.authorSubramanian, A.
dc.contributor.authorDhakal, Ashim
dc.contributor.authorSelvaraja, Shankar
dc.contributor.authorKomorowska, K.
dc.contributor.authorPeyskens, Frederic
dc.contributor.authorRyckeboer, Eva
dc.contributor.authorYebo, Nebiyu Adello
dc.contributor.authorRoelkens, Gunther
dc.contributor.authorLe Thomas, Nicolas
dc.date.accessioned2021-10-21T06:44:10Z
dc.date.available2021-10-21T06:44:10Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22012
dc.sourceIIOimport
dc.titleSpectroscopy-on-chip applications of silicon photonics
dc.typeProceedings paper
dc.contributor.imecauthorBaets, Roel
dc.contributor.imecauthorPeyskens, Frederic
dc.contributor.imecauthorRyckeboer, Eva
dc.contributor.imecauthorRoelkens, Gunther
dc.contributor.imecauthorLe Thomas, Nicolas
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.contributor.orcidimecRyckeboer, Eva::0000-0001-8648-3258
dc.contributor.orcidimecRoelkens, Gunther::0000-0002-4667-5092
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage86270I
dc.source.conferenceIntegrated Optics: Devices, Materials, and Technologies XVII
dc.source.conferencedate2/02/2013
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - open access
imec.internalnotesProceedings of SPIE; Vol. 8627


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