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Very small pitch micro bump array probing

dc.contributor.authorBoehm, Gunther
dc.contributor.authorKalt, Samuel
dc.contributor.authorKiesewetter, Joerg
dc.contributor.authorKlumpp, Armin
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorSchaefer, Wolfgang
dc.date.accessioned2021-10-21T06:47:18Z
dc.date.available2021-10-21T06:47:18Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22052
dc.sourceIIOimport
dc.titleVery small pitch micro bump array probing
dc.typeOral presentation
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewno
dc.source.conferenceIEEE Semiconductor Wafer Test Workshop
dc.source.conferencedate9/06/2013
dc.source.conferencelocationSan Diego, CA USA
dc.identifier.urlhttp://www.swtest.org/swtw_library/2013proc/PDF/SWTW13-9.pdf
imec.availabilityPublished - imec


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