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ESD entrypoints: coaxial cables vs. shielding apertures

dc.contributor.authorVan den Berghe, S.
dc.contributor.authorDe Zutter, Daniel
dc.date.accessioned2021-09-30T09:44:50Z
dc.date.available2021-09-30T09:44:50Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2207
dc.sourceIIOimport
dc.titleESD entrypoints: coaxial cables vs. shielding apertures
dc.typeProceedings paper
dc.contributor.imecauthorDe Zutter, Daniel
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage76
dc.source.endpage82
dc.source.conferenceElectrical Overstress/Electrostatic Discharge Symposium
dc.source.conferencedate23/09/1997
dc.source.conferencelocationSanta Clara, CA USA
imec.availabilityPublished - open access


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