dc.contributor.author | Caño de Andrade, Maria Glória | |
dc.contributor.author | Toledano Luque, Maria | |
dc.contributor.author | Fourati, Fatma | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Martino, Joao Antonio | |
dc.contributor.author | Claeys, Cor | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Van den Bosch, Geert | |
dc.contributor.author | Van Houdt, Jan | |
dc.date.accessioned | 2021-10-21T06:52:17Z | |
dc.date.available | 2021-10-21T06:52:17Z | |
dc.date.issued | 2013 | |
dc.identifier.issn | 0167-9317 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22099 | |
dc.source | IIOimport | |
dc.title | RTN assessment of traps in polysilicon cylindrical vertical FETs for NVM application | |
dc.type | Journal article | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Van den Bosch, Geert | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 105 | |
dc.source.endpage | 108 | |
dc.source.journal | Microelectronic Engineering | |
dc.source.volume | 109 | |
imec.availability | Published - open access | |
imec.internalnotes | INFOS 2013 paper | |