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Articles
RTN assessment of traps in polysilicon cylindrical vertical FETs for NVM application
Publication:
RTN assessment of traps in polysilicon cylindrical vertical FETs for NVM application
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Date
2013
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Caño de Andrade, Maria Glória
;
Toledano Luque, Maria
;
Fourati, Fatma
;
Degraeve, Robin
;
Martino, Joao Antonio
;
Claeys, Cor
;
Simoen, Eddy
;
Van den Bosch, Geert
;
Van Houdt, Jan
Journal
Microelectronic Engineering
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1897
since deposited on 2021-10-21
Acq. date: 2025-12-12
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Downloads
1
since deposited on 2021-10-21
Acq. date: 2025-12-12
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1897
since deposited on 2021-10-21
Acq. date: 2025-12-12
Citations