Publication:
RTN assessment of traps in polysilicon cylindrical vertical FETs for NVM application
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Acq. date: 2026-08-31
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1 since deposited on 2021-10-21
Acq. date: 2026-08-31
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1899 since deposited on 2021-10-21
2last month
1last week
Acq. date: 2026-08-31
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