dc.contributor.author | Celano, Umberto | |
dc.contributor.author | Chintala, Ravi Chandra | |
dc.contributor.author | Hoflijk, Ilse | |
dc.contributor.author | Moussa, Alain | |
dc.contributor.author | Vanhaeren, Danielle | |
dc.contributor.author | Mannarino, Manuel | |
dc.contributor.author | Nazir, Aftab | |
dc.contributor.author | Eyben, Pierre | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-10-21T06:53:54Z | |
dc.date.available | 2021-10-21T06:53:54Z | |
dc.date.issued | 2013 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22112 | |
dc.source | IIOimport | |
dc.title | Damage-free contact mode current sensing SPM: benchmarking PFTUNA vs. C-AFM | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Celano, Umberto | |
dc.contributor.imecauthor | Hoflijk, Ilse | |
dc.contributor.imecauthor | Moussa, Alain | |
dc.contributor.imecauthor | Vanhaeren, Danielle | |
dc.contributor.imecauthor | Mannarino, Manuel | |
dc.contributor.imecauthor | Nazir, Aftab | |
dc.contributor.imecauthor | Eyben, Pierre | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Celano, Umberto::0000-0002-2856-3847 | |
dc.contributor.orcidimec | Vanhaeren, Danielle::0000-0001-8624-9533 | |
dc.source.peerreview | no | |
dc.source.conference | SPM Dutch User Meeting 2013 | |
dc.source.conferencedate | 26/05/2013 | |
dc.source.conferencelocation | Eindhoven Nederlands | |
imec.availability | Published - imec | |