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Emerging challenges of ESD protections in FinFET technologies

dc.contributor.authorChen, Shih-Hung
dc.contributor.authorLinten, Dimitri
dc.contributor.authorHellings, Geert
dc.contributor.authorScholz, Mirko
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-21T06:56:03Z
dc.date.available2021-10-21T06:56:03Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22128
dc.sourceIIOimport
dc.titleEmerging challenges of ESD protections in FinFET technologies
dc.typeProceedings paper
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.source.peerreviewyes
dc.source.conferenceTaiwan ESD and Reliability Conference
dc.source.conferencedate4/11/2013
dc.source.conferencelocationHsinchu Taiwan
imec.availabilityPublished - imec


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