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Status and trends in Ge CMOS technology

dc.contributor.authorClaeys, Cor
dc.contributor.authorMitard, Jerome
dc.contributor.authorHellings, Geert
dc.contributor.authorEneman, Geert
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorLoo, Roger
dc.contributor.authorDelabie, Annelies
dc.contributor.authorSioncke, Sonja
dc.contributor.authorCaymax, Matty
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-21T07:00:22Z
dc.date.available2021-10-21T07:00:22Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22156
dc.sourceIIOimport
dc.titleStatus and trends in Ge CMOS technology
dc.typeProceedings paper
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorDelabie, Annelies
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage25
dc.source.endpage37
dc.source.conference4th International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors
dc.source.conferencedate8/07/2013
dc.source.conferencelocationVillard-de-Lans France
imec.availabilityPublished - open access
imec.internalnotesECS Transactions; Vol. 54, Issue 1


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