Influence of substrate rotation on the low frequency noise of strained triple-gate MuGFETs

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Authors
de Souza, Marcio; Doria, R.T.; Simoen, Eddy; Martino, Joao; Claeys, Cor; Pavanello, Marcello
Conference
IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference
Title
Influence of substrate rotation on the low frequency noise of strained triple-gate MuGFETs
Publication type
Proceedings paper
Embargo date
9999-12-31
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