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Temperature dependence of LF noise in UTBOX nMOSFETs
Publication:
Temperature dependence of LF noise in UTBOX nMOSFETs
Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
dos Santos, Sara
;
Martino, Joao
;
Aoulaiche, Marc
;
Jurczak, Gosia
;
Simoen, Eddy
;
Claeys, Cor
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1872
since deposited on 2021-10-21
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Acq. date: 2025-10-24
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Metrics
Views
1872
since deposited on 2021-10-21
413
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations