Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Key issues and techniques for characterizing time-dependent device-to-device variation of SRAM
Publication:
Key issues and techniques for characterizing time-dependent device-to-device variation of SRAM
Date
2013
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Duan, M.
;
Zhang, J. F.
;
Ji, Z.
;
Ma, J. G.
;
Zhang, W.
;
Kaczer, Ben
;
Schram, Tom
;
Ritzenthaler, Romain
;
Groeseneken, Guido
;
Asenov, A.
Journal
Abstract
Description
Metrics
Views
2028
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations
Metrics
Views
2028
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations