Authors

Duan, M.; Zhang, J. F.; Ji, Z.; Ma, J. G.; Zhang, W.; Kaczer, Ben; Schram, Tom; Ritzenthaler, Romain; Groeseneken, Guido; Asenov, A.

Conference

International Electron Devices Meeting - IEDM

Title

Key issues and techniques for characterizing time-dependent device-to-device variation of SRAM

Publication type

Proceedings paper