dc.contributor.author | Eneman, Geert | |
dc.contributor.author | De Keersgieter, An | |
dc.contributor.author | Witters, Liesbeth | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Vincent, Benjamin | |
dc.contributor.author | Hikavyy, Andriy | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Horiguchi, Naoto | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Thean, Aaron | |
dc.date.accessioned | 2021-10-21T07:29:52Z | |
dc.date.available | 2021-10-21T07:29:52Z | |
dc.date.issued | 2013-04 | |
dc.identifier.issn | 0021-4922 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22312 | |
dc.source | IIOimport | |
dc.title | SiGe or GeSn source/drain stressors on strained SiGe-channel pFETS: a TCAD study | |
dc.type | Journal article | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | De Keersgieter, An | |
dc.contributor.imecauthor | Witters, Liesbeth | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Vincent, Benjamin | |
dc.contributor.imecauthor | Hikavyy, Andriy | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.contributor.orcidimec | De Keersgieter, An::0000-0002-5527-8582 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Hikavyy, Andriy::0000-0002-8201-075X | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.identifier.doi | 10.7567/JJAP.52.04CC01 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 04CC01 | |
dc.source.journal | Japanese Journal of Applied Physics | |
dc.source.issue | 4 | |
dc.source.volume | 52 | |
dc.identifier.url | http://jjap.jsap.jp/link?JJAP/52/04CC01/ | |
imec.availability | Published - imec | |