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A TDI test imager in embedded CCD in CMOS technology

dc.contributor.authorErcan, Alper
dc.contributor.authorRobbelein, Jo
dc.contributor.authorDe Munck, Koen
dc.contributor.authorMinoglou, Kiki
dc.contributor.authorLauwers, Anne
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorDe Moor, Piet
dc.date.accessioned2021-10-21T07:30:36Z
dc.date.available2021-10-21T07:30:36Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22315
dc.sourceIIOimport
dc.titleA TDI test imager in embedded CCD in CMOS technology
dc.typeOral presentation
dc.contributor.imecauthorDe Munck, Koen
dc.contributor.imecauthorLauwers, Anne
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.imecauthorDe Moor, Piet
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceWorkshop CMOS Image Sensors for High Performance Applications
dc.source.conferencedate26/11/2013
dc.source.conferencelocationToulouse France
imec.availabilityPublished - open access


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