Publication:
SiGe channel technology: superior reliability toward ultra-thin EOT devices – Part I: NBTI
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Acq. date: 2025-12-16
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1801 since deposited on 2021-10-21
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Downloads
402 since deposited on 2021-10-21
115last month
15last week
Acq. date: 2025-12-16
Views
1801 since deposited on 2021-10-21
2last month
Acq. date: 2025-12-16
Citations