SiGe channel technology: superior reliability toward ultra-thin EOT devices – Part I: NBTI

Publication:

2013

Journal article

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IEEE Transactions on Electron Devices

836 since deposited on 2021-10-21

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Acq. date: 2026-04-27

1804 since deposited on 2021-10-21

Acq. date: 2026-04-27