Publication:
SiGe channel technology: superior reliability toward ultra-thin EOT devices – Part I: NBTI
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Acq. date: 2026-09-17
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1156 since deposited on 2021-10-21
70last month
12last week
Acq. date: 2026-09-17
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1806 since deposited on 2021-10-21
1last month
Acq. date: 2026-09-17
Citations