SiGe channel technology: superior reliability toward ultra-thin EOT devices – Part I: NBTI

Publication:

2013

Journal article

Author(s)

;

;

;

;

;

;

;

IEEE Transactions on Electron Devices

970 since deposited on 2021-10-21

28last month

24last week

Acq. date: 2026-07-16

1804 since deposited on 2021-10-21

Acq. date: 2026-07-16