SiGe channel technology: superior reliability toward ultra-thin EOT devices – Part I: NBTI

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Authors

Franco, Jacopo; Kaczer, Ben; Roussel, Philippe; Mitard, Jerome; Cho, Moon Ju; Witters, Liesbeth; Grasser, Tibor; Groeseneken, Guido

ISSN

0018-9383

Issue

1

Journal

IEEE Transactions on Electron Devices

Volume

60

Title

SiGe channel technology: superior reliability toward ultra-thin EOT devices – Part I: NBTI

Publication type

Journal article

Embargo date

2012-11-29

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