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3D IC analysis using magnetic field imaging

dc.contributor.authorGaudestad, Jan
dc.contributor.authorOrozco, A.
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorJeffers, A.
dc.contributor.authorCheng, B.
dc.contributor.authorWellstood, F.C.
dc.date.accessioned2021-10-21T07:45:51Z
dc.date.available2021-10-21T07:45:51Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22377
dc.sourceIIOimport
dc.title3D IC analysis using magnetic field imaging
dc.typeMeeting abstract
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.source.peerreviewyes
dc.source.conference33rd Annual Nano Testing symposium
dc.source.conferencedate13/11/2013
dc.source.conferencelocationOsaka Japan
imec.availabilityPublished - imec


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