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In-situ performance monitor employing threshold based notifications (TheBaN)

dc.contributor.authorGemmeke, Tobias
dc.contributor.authorKonijnenburg, Mario
dc.contributor.authorBachmann, Christian
dc.date.accessioned2021-10-21T07:48:35Z
dc.date.available2021-10-21T07:48:35Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22388
dc.sourceIIOimport
dc.titleIn-situ performance monitor employing threshold based notifications (TheBaN)
dc.typeProceedings paper
dc.contributor.imecauthorKonijnenburg, Mario
dc.contributor.imecauthorBachmann, Christian
dc.contributor.orcidimecKonijnenburg, Mario::0000-0001-8016-0888
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage271
dc.source.endpage274
dc.source.conferenceEuropean Solid-State Circuits Conference - ESSCIRC
dc.source.conferencedate16/09/2013
dc.source.conferencelocationBucharest Romania
dc.identifier.urlhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6649125&tag=1
imec.availabilityPublished - open access


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