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Multiphonon processes as the origin of reliability issues

dc.contributor.authorGoes, Wolfgang
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorSchanovsky, F.
dc.contributor.authorBina, M.
dc.contributor.authorBaumgartner, O.
dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, Tibor
dc.date.accessioned2021-10-21T07:53:18Z
dc.date.available2021-10-21T07:53:18Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22406
dc.sourceIIOimport
dc.titleMultiphonon processes as the origin of reliability issues
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage31
dc.source.endpage47
dc.source.conferenceSemiconductors, Dielectrics, and Materials for Nanoelectronics II
dc.source.conferencedate27/10/2013
dc.source.conferencelocationSan Francisco, CA USA
dc.identifier.urlhttp://ecst.ecsdl.org/content/58/7/31.abstract
imec.availabilityPublished - open access
imec.internalnotesECS Transactions; Vol. 58, Issue 7


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