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Understanding the intrinsic characteristics and memory trade-offs of sub-μA filamentary RRAM operation

dc.contributor.authorGoux, Ludovic
dc.contributor.authorFantini, Andrea
dc.contributor.authorDegraeve, Robin
dc.contributor.authorRaghavan, Naga
dc.contributor.authorNigon, Robin
dc.contributor.authorStrangio, Sebastiano
dc.contributor.authorWouters, Dirk
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorChen, Yangyin
dc.contributor.authorKomura, Masanori
dc.contributor.authorDe Stefano, Francesca
dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorJurczak, Gosia
dc.date.accessioned2021-10-21T07:56:04Z
dc.date.available2021-10-21T07:56:04Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22416
dc.sourceIIOimport
dc.titleUnderstanding the intrinsic characteristics and memory trade-offs of sub-μA filamentary RRAM operation
dc.typeProceedings paper
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorChen, Yangyin
dc.contributor.imecauthorDe Stefano, Francesca
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecFantini, Andrea::0000-0002-3220-8856
dc.contributor.orcidimecGovoreanu, Bogdan::0000-0001-7210-2979
dc.contributor.orcidimecAfanasiev, Valeri::0000-0001-5018-4539
dc.source.peerreviewyes
dc.source.beginpage162
dc.source.endpage163
dc.source.conferenceVLSI Technology Symposium
dc.source.conferencedate11/06/2013
dc.source.conferencelocationKyoto Japan
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6576641&queryText%3DUnderstanding+the+intrinsic+characteristics+a
imec.availabilityPublished - imec


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