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dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorAjaykumar, Arjun
dc.contributor.authorLipowicz, Hubert
dc.contributor.authorChen, Yangyin
dc.contributor.authorLiu, Jen-Chieh
dc.contributor.authorDegraeve, Robin
dc.contributor.authorZhang, Leqi
dc.contributor.authorClima, Sergiu
dc.contributor.authorGoux, Ludovic
dc.contributor.authorRadu, Iuliana
dc.contributor.authorFantini, Andrea
dc.contributor.authorRaghavan, Naga
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorKim, Woosik
dc.contributor.authorRedolfi, Augusto
dc.contributor.authorWouters, Dirk
dc.contributor.authorAltimime, Laith
dc.contributor.authorJurczak, Gosia
dc.date.accessioned2021-10-21T07:58:16Z
dc.date.available2021-10-21T07:58:16Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22423
dc.sourceIIOimport
dc.titlePerformance and reliability of ultra-thin HfO2-based RRAM (UTO-RRAM)
dc.typeProceedings paper
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorAjaykumar, Arjun
dc.contributor.imecauthorChen, Yangyin
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorRedolfi, Augusto
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage48
dc.source.endpage51
dc.source.conference5th International Memory Workshop - IMW
dc.source.conferencedate26/05/2013
dc.source.conferencelocationMonterey, CA USA
imec.availabilityPublished - open access


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