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Hydrogen-related volatile defects as the possible cause for the recoverable component of NBTI

dc.contributor.authorGrasser, T.
dc.contributor.authorRott, K.
dc.contributor.authorReisinger, H.
dc.contributor.authorWaltl, M.
dc.contributor.authorWagner, P.
dc.contributor.authorSchanovsky, F.
dc.contributor.authorGoes, W.
dc.contributor.authorPobegen, G.
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-21T07:59:27Z
dc.date.available2021-10-21T07:59:27Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22427
dc.sourceIIOimport
dc.titleHydrogen-related volatile defects as the possible cause for the recoverable component of NBTI
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage409
dc.source.endpage412
dc.source.conferenceInternational Electron Devices Meeting - IEDM
dc.source.conferencedate9/12/2013
dc.source.conferencelocationWashington, DC USA
imec.availabilityPublished - open access


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