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Advanced characterization of oxide traps: the dynamic time-dependent defect spectroscopy

dc.contributor.authorGrasser, Tibor
dc.contributor.authorRott, K.
dc.contributor.authorReisinger, H.
dc.contributor.authorWagner, P.J.
dc.contributor.authorGoes, W
dc.contributor.authorSchanovsky, F.
dc.contributor.authorWaltl, M.
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-21T07:59:44Z
dc.date.available2021-10-21T07:59:44Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22428
dc.sourceIIOimport
dc.titleAdvanced characterization of oxide traps: the dynamic time-dependent defect spectroscopy
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewyes
dc.source.beginpage2D.2
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate14/04/2013
dc.source.conferencelocationMonterey, CA USA
dc.identifier.urlhttp://dx.doi.org/10.1109/IRPS.2013.6531957
imec.availabilityPublished - imec


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