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Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor

dc.contributor.authorJablonski, Michal
dc.contributor.authorBossuyt, Frederick
dc.contributor.authorVanfleteren, Jan
dc.contributor.authorVervust, Thomas
dc.contributor.authorde Vries, Hans
dc.date.accessioned2021-10-21T08:29:41Z
dc.date.available2021-10-21T08:29:41Z
dc.date.issued2013
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22533
dc.sourceIIOimport
dc.titleReliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor
dc.typeJournal article
dc.contributor.imecauthorBossuyt, Frederick
dc.contributor.imecauthorVanfleteren, Jan
dc.contributor.imecauthorVervust, Thomas
dc.contributor.orcidimecBossuyt, Frederick::0000-0003-3350-9295
dc.contributor.orcidimecVanfleteren, Jan::0000-0002-9654-7304
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage956
dc.source.endpage963
dc.source.journalMicroelectronics Reliability
dc.source.volume53
imec.availabilityPublished - open access


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