Authors

Jablonski, Michal; Bossuyt, Frederick; Vanfleteren, Jan; Vervust, Thomas; de Vries, Hans

ISSN

0026-2714

Journal

Microelectronics Reliability

Volume

53

Title

Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor

Publication type

Journal article

Embargo date

9999-12-31