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Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor
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Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor
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Date
2013
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jablonski, Michal
;
Bossuyt, Frederick
;
Vanfleteren, Jan
;
Vervust, Thomas
;
de Vries, Hans
Journal
Microelectronics Reliability
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1967
since deposited on 2021-10-21
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Acq. date: 2025-12-15
Citations
Metrics
Views
1967
since deposited on 2021-10-21
3
last month
1
last week
Acq. date: 2025-12-15
Citations