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Negative bias temperature instability lifetime prediction: problems and solutions

dc.contributor.authorJi, Z.
dc.contributor.authorHatta, S. F. W. M.
dc.contributor.authorZhang, J. F.
dc.contributor.authorMa, G. M.
dc.contributor.authorZhang, W.
dc.contributor.authorSoin, N.
dc.contributor.authorKaczer, Ben
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-21T08:35:15Z
dc.date.available2021-10-21T08:35:15Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22551
dc.sourceIIOimport
dc.titleNegative bias temperature instability lifetime prediction: problems and solutions
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.source.peerreviewyes
dc.source.beginpage413
dc.source.endpage416
dc.source.conferenceInternational Electron Devices Meeting - IEDM
dc.source.conferencedate9/12/2013
dc.source.conferencelocationWashington, DC USA
imec.availabilityPublished - imec


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