dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Chen, Chris | |
dc.contributor.author | Watt, Jeff | |
dc.contributor.author | Chanda, Kaushik | |
dc.contributor.author | Weckx, Pieter | |
dc.contributor.author | Toledano Luque, Maria | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Grasser, Tibor | |
dc.date.accessioned | 2021-10-21T08:38:46Z | |
dc.date.available | 2021-10-21T08:38:46Z | |
dc.date.issued | 2013 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22562 | |
dc.source | IIOimport | |
dc.title | Reliability and performance considerations for NMOSFET pass gates in FPGA applications | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Chen, Chris | |
dc.contributor.imecauthor | Weckx, Pieter | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.source.peerreview | yes | |
dc.source.conference | International Integrated Reliability Workshop - IIRW | |
dc.source.conferencedate | 13/10/2013 | |
dc.source.conferencelocation | South Lake Tahoe, CA USA | |
imec.availability | Published - imec | |