Bias temperature instability analysis in SRAM decoder

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Authors
Khan, Seyab; Hamdioui, Said; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky
Conference
18th IEEE European Test Symposium - ETS
Title
Bias temperature instability analysis in SRAM decoder
Publication type
Proceedings paper
Embargo date
9999-12-31
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