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Impact of partial resistive defects and bias temperature instability on SRAM decoder reliability

dc.contributor.authorKhan, Seyab
dc.contributor.authorTaouil, Mottaqiallah
dc.contributor.authorHamdioui, Said
dc.contributor.authorKukner, Halil
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-21T08:50:42Z
dc.date.available2021-10-21T08:50:42Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22598
dc.sourceIIOimport
dc.titleImpact of partial resistive defects and bias temperature instability on SRAM decoder reliability
dc.typeProceedings paper
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.conference8th International Design and Test Symposium - IDTS
dc.source.conferencedate16/12/2012
dc.source.conferencelocationMarrakesh Morocco
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6727124&searchWithin%3Dkhan%26sortType%3Dasc_p_Sequence%26filter%3DAN
imec.availabilityPublished - open access


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