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Flexible imaging sensors with end application towards x-ray imaging

dc.contributor.authorKumar, Abhishek
dc.contributor.authorMoet, Date
dc.contributor.authorvan der Steen, Jan-Laurens
dc.contributor.authorMalinowski, Pawel
dc.contributor.authorShafique, Umar
dc.contributor.authorMyny, Kris
dc.contributor.authorSimon, Matthias
dc.contributor.authorAndriessen, Ronn
dc.contributor.authorHeremans, Paul
dc.contributor.authorGelinck, Gerwin
dc.date.accessioned2021-10-21T08:58:57Z
dc.date.available2021-10-21T08:58:57Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22622
dc.sourceIIOimport
dc.titleFlexible imaging sensors with end application towards x-ray imaging
dc.typeOral presentation
dc.contributor.imecauthorvan der Steen, Jan-Laurens
dc.contributor.imecauthorMalinowski, Pawel
dc.contributor.imecauthorMyny, Kris
dc.contributor.imecauthorAndriessen, Ronn
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecMalinowski, Pawel::0000-0002-2934-470X
dc.contributor.orcidimecMyny, Kris::0000-0002-5230-495X
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.source.peerreviewno
dc.source.conferenceSPIE Optics+Photonics: Organic Semiconductors in Sensors and Bioelectronics VI
dc.source.conferencedate25/08/2013
dc.source.conferencelocationSan Diego, CA USA
imec.availabilityPublished - imec
imec.internalnotesConference 8831; Paper 225


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