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Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines

dc.contributor.authorKummer, K.
dc.contributor.authorFondacaro, A.
dc.contributor.authorYakhou-Harris, F.
dc.contributor.authorSessi, V.
dc.contributor.authorPobedinskas, Paulius
dc.contributor.authorJanssens, Stoffel
dc.contributor.authorHaenen, Ken
dc.contributor.authorWilliams, O.A.
dc.contributor.authorHees, J.
dc.contributor.authorBrookes, N.B.
dc.date.accessioned2021-10-21T08:59:39Z
dc.date.available2021-10-21T08:59:39Z
dc.date.issued2013
dc.identifier.issn0034-6748
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22624
dc.sourceIIOimport
dc.titleThin conductive diamond films as beam intensity monitors for soft x-ray beamlines
dc.typeJournal article
dc.contributor.imecauthorPobedinskas, Paulius
dc.contributor.imecauthorHaenen, Ken
dc.contributor.orcidimecPobedinskas, Paulius::0000-0001-8136-5172
dc.contributor.orcidimecHaenen, Ken::0000-0001-6711-7367
dc.date.embargo9999-12-31
dc.identifier.doi10.1063/1 4794439
dc.source.peerreviewyes
dc.source.beginpage35105
dc.source.journalReview of Scientific Instruments
dc.source.issue3
dc.source.volume84
imec.availabilityPublished - open access


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