Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines

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Authors

Kummer, K.; Fondacaro, A.; Yakhou-Harris, F.; Sessi, V.; Pobedinskas, Paulius; Janssens, Stoffel; Haenen, Ken; Williams, O.A.; Hees, J.; Brookes, N.B.

DOI

10.1063/1 4794439

ISSN

0034-6748

Issue

3

Journal

Review of Scientific Instruments

Volume

84

Title

Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines

Publication type

Journal article

Embargo date

9999-12-31

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