Publication:

Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines

Date

2013

Journal article

https://doi.org/10.1063/1 4794439

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Files

28328.pdf 1.84 MB

Author(s)

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Yakhou-Harris, F.

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Pobedinskas, Paulius

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Janssens, Stoffel

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Journal

Review of Scientific Instruments

Metrics

1961 since deposited on 2021-10-21

Acq. date: 2025-12-12