Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines

Kummer, K.; Fondacaro, A.; Yakhou-Harris, F.; Sessi, V.; Pobedinskas, Paulius; Janssens, Stoffel; Haenen, Ken; Williams, O.A.; Hees, J.; Brookes, N.B.

doi:10.1063/1 4794439

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Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines

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2013

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https://doi.org/10.1063/1 4794439

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Review of Scientific Instruments

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Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines

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