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Mid-infrared generation by frequency down-conversion across 1.2 octaves in a normally-dispersive silicon wire

dc.contributor.authorKuyken, Bart
dc.contributor.authorVerheyen, Peter
dc.contributor.authorTannouri, P.
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorBaets, Roel
dc.contributor.authorRoelkens, Gunther
dc.contributor.authorGreen, William M.J.
dc.date.accessioned2021-10-21T09:01:00Z
dc.date.available2021-10-21T09:01:00Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22628
dc.sourceIIOimport
dc.titleMid-infrared generation by frequency down-conversion across 1.2 octaves in a normally-dispersive silicon wire
dc.typeProceedings paper
dc.contributor.imecauthorKuyken, Bart
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorBaets, Roel
dc.contributor.imecauthorRoelkens, Gunther
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.contributor.orcidimecRoelkens, Gunther::0000-0002-4667-5092
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpageCTh1F.2
dc.source.conferenceLaser Science to Photonics Applications - CLEO
dc.source.conferencedate9/06/2013
dc.source.conferencelocationSan Jose, California USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6833317&queryText%3DMid-infrared+generation+by+frequency+down-con
imec.availabilityPublished - open access


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