Show simple item record

ESD in FinFET technologies: past learning and emerging challenges

dc.contributor.authorLinten, Dimitri
dc.contributor.authorHellings, Geert
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-21T09:27:09Z
dc.date.available2021-10-21T09:27:09Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22705
dc.sourceIIOimport
dc.titleESD in FinFET technologies: past learning and emerging challenges
dc.typeProceedings paper
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage2B.5
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate14/04/2013
dc.source.conferencelocationMonterey, CA USA
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
26562.pdf
Size:
690.7Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record