Defects in As-grown silicon and their evolution during heat treatments
dc.contributor.author | Vanhellemont, Jan | |
dc.contributor.author | Dornberger, E. | |
dc.contributor.author | Esfandyari, J. | |
dc.contributor.author | Kissinger, G. | |
dc.contributor.author | Trauwaert, Marie-Astrid | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Gräf, D. | |
dc.contributor.author | Lambert, U. | |
dc.contributor.author | von Ammon, W. | |
dc.date.accessioned | 2021-09-30T09:58:19Z | |
dc.date.available | 2021-09-30T09:58:19Z | |
dc.date.issued | 1997 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2270 | |
dc.source | IIOimport | |
dc.title | Defects in As-grown silicon and their evolution during heat treatments | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 341 | |
dc.source.endpage | 6 | |
dc.source.conference | Defects in Semiconductors 19 - ICDS 19 | |
dc.source.conferencedate | 21/07/1997 | |
dc.source.conferencelocation | Aveiro Portugal | |
imec.availability | Published - open access | |
imec.internalnotes | Materials Science Forum; Vols. 258-263 |