dc.contributor.author | Meneghini, Matteo | |
dc.contributor.author | Bisi, Davide | |
dc.contributor.author | Marcon, Denis | |
dc.contributor.author | Stoffels, Steve | |
dc.contributor.author | Van Hove, Marleen | |
dc.contributor.author | Wu, Tian-Li | |
dc.contributor.author | Decoutere, Stefaan | |
dc.contributor.author | Meneghesso, Gaudenzio | |
dc.contributor.author | Zanoni, Enrico | |
dc.date.accessioned | 2021-10-21T10:02:24Z | |
dc.date.available | 2021-10-21T10:02:24Z | |
dc.date.issued | 2013 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22800 | |
dc.source | IIOimport | |
dc.title | Transient performance, breakdown and degradation of power transistors GaN on Si technology | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Marcon, Denis | |
dc.contributor.imecauthor | Stoffels, Steve | |
dc.contributor.imecauthor | Decoutere, Stefaan | |
dc.contributor.orcidimec | Decoutere, Stefaan::0000-0001-6632-6239 | |
dc.source.peerreview | yes | |
dc.source.conference | 45th annual meeting of the Associazione Gruppo Italiano di Elettronica (GE Association) | |
dc.source.conferencedate | 17/06/2013 | |
dc.source.conferencelocation | Udine Italy | |
imec.availability | Published - imec | |