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OLIMPEX: measurement and parameter extraction tools for advanced laser diodes

dc.contributor.authorVerhoeve, Piet
dc.contributor.authorDiet, Geert
dc.contributor.authorSarlet, Gert
dc.contributor.authorMorthier, Geert
dc.contributor.authorBaets, Roel
dc.contributor.authorFarrell, T.
dc.date.accessioned2021-09-30T10:02:41Z
dc.date.available2021-09-30T10:02:41Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2288
dc.sourceIIOimport
dc.titleOLIMPEX: measurement and parameter extraction tools for advanced laser diodes
dc.typeProceedings paper
dc.contributor.imecauthorMorthier, Geert
dc.contributor.imecauthorBaets, Roel
dc.contributor.orcidimecMorthier, Geert::0000-0003-1819-6489
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.source.peerreviewno
dc.source.beginpage109
dc.source.endpage112
dc.source.conferenceProceedings of the Annual Symposium of the IEEE/LEOS Benelux Chapter; November 26, 1997. Eindhoven, The Netherlands.
dc.source.conferencelocation
imec.availabilityPublished - imec


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