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dc.contributor.authorOulton, Rupert
dc.contributor.authorGennaro, Sylvain
dc.contributor.authorSonnefraud, Yannick
dc.contributor.authorMaier, Stefan
dc.contributor.authorVerellen, Niels
dc.contributor.authorVan Dorpe, Pol
dc.contributor.authorMoshchalkov, Victor
dc.date.accessioned2021-10-21T10:40:37Z
dc.date.available2021-10-21T10:40:37Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22896
dc.sourceIIOimport
dc.titleSpectral interferometric microscopy for broadband optical phase and amplitude measurement of individual nano-antennas
dc.typeOral presentation
dc.contributor.imecauthorVerellen, Niels
dc.contributor.imecauthorVan Dorpe, Pol
dc.contributor.orcidimecVerellen, Niels::0000-0001-5110-4158
dc.contributor.orcidimecVan Dorpe, Pol::0000-0003-0918-1664
dc.source.peerreviewno
dc.source.conferenceMRS Fall Meeting & Exhibit
dc.source.conferencedate1/12/2013
dc.source.conferencelocationBoston, MA USA
dc.identifier.urlhttps://mrsfall13.zerista.com/event/member/97532
imec.availabilityPublished - imec


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