dc.contributor.author | Pacco, Antoine | |
dc.contributor.author | Holsteyns, Frank | |
dc.contributor.author | De Gendt, Stefan | |
dc.date.accessioned | 2021-10-21T10:41:00Z | |
dc.date.available | 2021-10-21T10:41:00Z | |
dc.date.issued | 2013 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22897 | |
dc.source | IIOimport | |
dc.title | A study of nanoparticle removal on patterned surfaces | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Pacco, Antoine | |
dc.contributor.imecauthor | Holsteyns, Frank | |
dc.contributor.imecauthor | De Gendt, Stefan | |
dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 17 | |
dc.source.endpage | 23 | |
dc.source.conference | Semiconductor Cleaning Science and Technology 13 | |
dc.source.conferencedate | 27/10/2013 | |
dc.source.conferencelocation | San Francisco, CA USA | |
imec.availability | Published - imec | |
imec.internalnotes | ECS Transactions; Vol. 58, Issue 6 | |