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Comparative experimental study between tensile and compressive uniaxially stressed nMuGFETs under x-ray radiation focusing on analog behavior
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Comparative experimental study between tensile and compressive uniaxially stressed nMuGFETs under x-ray radiation focusing on analog behavior
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Date
2013
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Peruzzi, V.
;
Gimenez, Salvador
;
Agopian, Paula
;
Silveira, M.
;
Marino, Jaoa
;
Simoen, Eddy
;
Claeys, Cor
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1854
since deposited on 2021-10-21
Acq. date: 2025-12-11
Citations
Metrics
Views
1854
since deposited on 2021-10-21
Acq. date: 2025-12-11
Citations