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Microscopic origin of random telegraph noise fluctuations in aggressively scaled RRAM and its impact on read disturb variability
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Authors
Raghavan, Naga
;
Degraeve, Robin
;
Fantini, Andrea
;
Goux, Ludovic
;
Strangio, Sebastiano
;
Govoreanu, Bogdan
;
Wouters, Dirk
;
Groeseneken, Guido
;
Jurczak, Gosia
Conference
International Reliability Physics Symposium - IRPS
Title
Microscopic origin of random telegraph noise fluctuations in aggressively scaled RRAM and its impact on read disturb variability
Publication type
Proceedings paper
Embargo date
9999-12-31
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