Publication:
Stochastic variability of vacancy filament configuration in ultra-thin dielectric RRAM and its impact on OFF-state reliability
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1863 since deposited on 2021-10-21
1last month
1last week
Acq. date: 2026-01-12
Citations
Metrics
Views
1863 since deposited on 2021-10-21
1last month
1last week
Acq. date: 2026-01-12
Citations