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Influence of etch process sequence on damage formation in ultra low-k dielectrics
Publication:
Influence of etch process sequence on damage formation in ultra low-k dielectrics
Date
2013
Meeting abstract
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26330.pdf
102.33 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Redzheb, Murad
;
Souriau, Laurent
;
de Marneffe, Jean-Francois
;
Baklanov, Mikhaïl
Journal
Abstract
Description
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1878
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Acq. date: 2025-10-24
Citations
Metrics
Views
1878
since deposited on 2021-10-21
415
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations