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Comparison of system-level ESD design methodologies – towards the efficient and ESD robust design of systems

dc.contributor.authorScholz, Mirko
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorLinten, Dimitri
dc.contributor.authorHellings, Geert
dc.contributor.authorSawada, Masanori
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-21T11:49:01Z
dc.date.available2021-10-21T11:49:01Z
dc.date.issued2013
dc.identifier.issn1530-4388
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23051
dc.sourceIIOimport
dc.titleComparison of system-level ESD design methodologies – towards the efficient and ESD robust design of systems
dc.typeJournal article
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorVandersteen, Gerd
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecChen, Shih-Hung::0000-0002-6481-2951
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage213
dc.source.endpage222
dc.source.journalIEEE Transactions on Device and Materials Reliability
dc.source.issue1
dc.source.volume13
dc.identifier.urlIEEE Xplore
imec.availabilityPublished - imec


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