Tunnel emission for Co and Cr related levels in p-type Ge

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Authors
Segers, Siegfried; Lauwaert, Johan; Clauws, Paul; Simoen, Eddy; Vanhellemont, Jan; Callens, Freddy; Vrielinck, Henk
Conference
International Conference on Defects in Semiconductors
Title
Tunnel emission for Co and Cr related levels in p-type Ge
Publication type
Meeting abstract
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