Publication:
Impact of oxide trap passivation by fluorine on the low-frequency noise behavior of gate-last pMOSFETs
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1784 since deposited on 2021-10-21
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Acq. date: 2026-08-26
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Statistics
Views
1784 since deposited on 2021-10-21
2last month
1last week
Acq. date: 2026-08-26
Citations