Authors

Simoen, Eddy; Veloso, Anabela; Horiguchi, Naoto; Paraschiv, Vasile; Claeys, Cor

Conference

International Conference on 1/f Noise and Fluctuations - ICNF

Title

Impact of oxide trap passivation by fluorine on the low-frequency noise behavior of gate-last pMOSFETs

Publication type

Proceedings paper